федеральное государственное автономное образовательное учреждение высшего образования
«Самарский национальный исследовательский университет имени академика С.П. Королева»

Trusova, Alla Y.

  • Department of Mathematics and Business Informatics, associate professor
2021
  • 1 Trusova A.Yu., Ilina A.I. Методология формирования латентных индикаторов // Vestnik of Samara State Aerospace University 2021. — Vol. 12. № 3. — P. 179-191
1999
  • 1 Rozhkov V.A., Trusova A.Yu. Energy barriers at the interfaces in the MIS system Me-Yb2O3-Si // Technical Physics 1999. — Vol. 44. Issue 4. — P. 404-408
1998
  • 1 Rozhkov V.A., Trusova A.Yu., Berezhnoy I.G. Silicon MIS-structures with ytterbium oxide films // Physics of Low-Dimensional Structures 1998. — Vol. 1998. Issue 7-8. — P. 7-16
  • 2 Rozhkov V.A., Trusova A.Yu., Berezhnoǐ I.G. Energy barriers and trapping centers in silicon metal-insulator-semiconductor structures with samarium and ytterbium oxide insulators // Technical Physics Letters 1998. — Vol. 24. Issue 3. — P. 217-219
  • 3 Rozhkov V.A., Trusova A.Yu., Berezhnoy I.G. Energy barriers and trapping centers in MIS-structures with Yb2O3 // Proceedings of the International Conference on Electric Charge in Solid Insulators, CSC. — 1998. — P. 684-687
  • 4 Rozhkov V.A., Trusova A.Yu., Berezhnoy I.G. Energy barriers and trapping centers in misstructures with Yb2O3 // Vide: Science, Technique et Applications 1998. — Issue 287 SUPPL.1. — P. 684-687
  • 5 Rozhkov V.A., Trusova A.Yu., Berezhnoy I.G. Silicon MIS structures using samarium oxide films // Thin Solid Films 1998. — Vol. 325. Issue 1-2. — P. 151-155
1997
  • 1 Rozhkov V.A., Trusova A.Yu. Silicon metal-dielectric-semiconductor varicaps with an yttrium oxide dielectric // Technical Physics Letters 1997. — Vol. 23. Issue 6. — P. 475-477
1995
  • 1 Rozhkov V.A., Petrov A.I., Goncharov V.P. etc. Electrical breakdown of rare earth oxide insulator thin films in silicon MIS structures // IEEE International Conference on Conduction & Breakdown in Solid Dielectrics. — 1995. — P. 418-422
  • 2 Rozhkov V.A., Goncharov V.P., Trusova A.Yu. Electrical and photoelectrical properties of MIS structures with rare earth oxide films as insulator // IEEE International Conference on Conduction & Breakdown in Solid Dielectrics. — 1995. — P. 552-555